Microsphere-based super-resolution optical microscope with a resolution of ≦100nm.
Optical microscope with a resolution of ≦100nm, capable of non-destructive observation in full color.
It is possible to observe beyond the diffraction limit with spatial resolution below 100nm, allowing for non-destructive, full-color observation of nanoscale structures. It can be used for semiconductor research and development, as well as advanced material imaging, or as an alternative to SEM and AFM. The objective lens can also be sold separately.
- Company：日本レーザー
- Price：Other
